SN74LVTH182502APMR Supplier,Distributor,Price,Datasheet,PDF

SN74LVTH182502APMR distributor(IC SCAN-TEST-DEV/XCVR 64-LQFP),SN74LVTH182502APMR short lead time

Part Number:   SN74LVTH182502APMR
Description:   IC SCAN-TEST-DEV/XCVR 64-LQFP
Category:   TI distributor
Manufacture:   Texas Instruments(TI)
Package:   IC SCAN-TEST-DEV/XCVR 64-LQFP
Standard Package:   
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1 pcs
Mininum order quantity from 1PCS SN74LVTH182502APMR
Mininum order value from 1USD
2 days
lead time of SN74LVTH182502APMR is from 2 to 5 days
12 hours
Fast quotation of SN74LVTH182502APMR within 12 hours
60 days
60 days full quality warranty of SN74LVTH182502APMR
 
1, we will give you new and original parts with factory sealed package
2, Quality warranted: All products have to be passed our Quality Control before delivery.
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The ’LV4040A devices are 12-bit asynchronous binary counters with the outputs of all stages available externally. A high level at the clear (CLR) input asynchronously clears the counter and resets all outputs low. SN74LVTH182502APMR Texas Instruments(TI) IC SCAN-TEST-DEV/XCVR 64-LQFP The count is advanced on a high-to-low transition at the clock (CLK) input. Applications include time-delay circuits, counter controls, and frequency-dividing circuits. These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the devices when they are powered down. SN74LVTH182502APMR Texas Instruments(TI) IC SCAN-TEST-DEV/XCVR 64-LQFP
· Available in Texas Instruments NanoStar™ · ±24-mA Output Drive at 3.3 V and NanoFree™ Packages · Ioff Supports Partial-Power-Down ModeSN74LVTH182502APMR Texas Instruments(TI) IC SCAN-TEST-DEV/XCVR 64-LQFP
· Supports 5-V VCC Operation Operation SN74LVTH182502APMR Texas Instruments(TI) IC SCAN-TEST-DEV/XCVR 64-LQFP
· Inputs Accept Voltages to 5.5 V · Latch-Up Performance Exceeds 100 mA Per
· One Unbuffered Inverter (SN74LVC1GU04) JESD 78, Class II and One Buffered Inverter (SN74LVC1G04) · ESD Protection Exceeds JESD 22 SN74LVTH182502APMR Texas Instruments(TI) IC SCAN-TEST-DEV/XCVR 64-LQFP
· Suitable for Commonly Used Clock – 2000-V Human-Body Model (A114-A) Frequencies: – 200-V Machine Model (A115-A)15 kHz, 3.58 MHz, 4.43 MHz, 13 MHz, – 1000-V Charged-Device Model (C101) 25 MHz, 26 MHz, 27 MHz, 28 MHz
· Max tpd of 2.4 ns at 3.3 V SN74LVTH182502APMR Texas Instruments(TI) IC SCAN-TEST-DEV/XCVR 64-LQFP
· Low Power Consumption, 10-mA Max ICC